Information card for entry 2103475
| Formula |
C32 H36 N3 O7 P3 |
| Calculated formula |
C32 H36 N3 O7 P3 |
| SMILES |
c1(ccccc1)OP12=NP(=NP(c3ccccc3)(c3ccccc3)=N1)(Oc1ccccc1)OCCOCCOCCOCCO2 |
| Title of publication |
Structural investigations of phosphorus–nitrogen compounds. 5. Relationships between molecular parameters of 2,2-diphenyl-4,6-<i>cis</i>-oxytetra(ethyleneoxy)-4,6-<i>R</i>~2~-cyclotriphosphazatrienes (<i>R</i> = Cl, OCH~2~CF~3~, OPh, OMe, NHPh, NHBu^<i>t^</i>) and substituent basicity constants |
| Authors of publication |
Beşli, Serap; Coles, Simon J.; Davies, David B.; Hursthouse, Michael B.; Kılıç, Adem; Mayer, Thomas A.; Shaw, Robert A. |
| Journal of publication |
Acta Crystallographica Section B |
| Year of publication |
2002 |
| Journal volume |
58 |
| Journal issue |
6 |
| Pages of publication |
1067 - 1073 |
| a |
10.166 ± 0.002 Å |
| b |
12.105 ± 0.002 Å |
| c |
13.313 ± 0.003 Å |
| α |
88.86 ± 0.03° |
| β |
86.54 ± 0.03° |
| γ |
78.14 ± 0.03° |
| Cell volume |
1600.3 ± 0.6 Å3 |
| Cell temperature |
150 ± 2 K |
| Ambient diffraction temperature |
150 ± 2 K |
| Number of distinct elements |
5 |
| Space group number |
1 |
| Hermann-Mauguin space group symbol |
P 1 |
| Hall space group symbol |
P 1 |
| Residual factor for all reflections |
0.0894 |
| Residual factor for significantly intense reflections |
0.0537 |
| Weighted residual factors for significantly intense reflections |
0.1154 |
| Weighted residual factors for all reflections included in the refinement |
0.1315 |
| Goodness-of-fit parameter for all reflections included in the refinement |
0.941 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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