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Information card for entry 2103737
Preview
| Coordinates | 2103737.cif |
|---|---|
| Original IUCr paper | HTML |
| External links | PubChem |
| Chemical name | [2.2]paracyclophane-4,15-disulfonimide |
|---|---|
| Formula | C20 H21 N3 O4 S2 |
| Calculated formula | C20 H21 N3 O4 S2 |
| SMILES | O=S1(=O)NS(=O)(=O)c2cc3CCc4cc1c(cc4)CCc2cc3.CC#N.CC#N |
| Title of publication | Influence of aromatic sulfonation on the geometry of [2.2]paracyclophane: crystal structures of one sulfonate, one disulfonic anhydride and five disulfonimides |
| Authors of publication | De Ridder, Dirk J. A.; Goubitz, Kees; Fontijn, Margot; Čapková, Pavla; Dova, Eva; Schenk, Henk |
| Journal of publication | Acta Crystallographica Section B |
| Year of publication | 2001 |
| Journal volume | 57 |
| Journal issue | 6 |
| Pages of publication | 780 - 790 |
| a | 8.725 ± 0.007 Å |
| b | 10.259 ± 0.007 Å |
| c | 10.95 ± 0.006 Å |
| α | 90° |
| β | 92.87 ± 0.04° |
| γ | 90° |
| Cell volume | 978.9 ± 1.2 Å3 |
| Cell temperature | 293 K |
| Ambient diffraction temperature | 293 K |
| Number of distinct elements | 5 |
| Space group number | 11 |
| Hermann-Mauguin space group symbol | P 1 21/m 1 |
| Hall space group symbol | -P 2yb |
| Residual factor for all reflections | 0.056 |
| Residual factor for significantly intense reflections | 0.056 |
| Weighted residual factors for all reflections | 0.064 |
| Weighted residual factors for all reflections included in the refinement | 0.064 |
| Goodness-of-fit parameter for all reflections | 0.764 |
| Goodness-of-fit parameter for all reflections included in the refinement | 0.764 |
| Diffraction radiation wavelength | 0.71069 Å |
| Diffraction radiation type | MoKα |
| Has coordinates | Yes |
| Has disorder | No |
| Has Fobs | No |
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