Information card for entry 2107444
| Chemical name |
1,4-bis (5-hexyl-2-thienyl) butane-1,4 dione |
| Formula |
C24 H34 O2 S2 |
| Calculated formula |
C24 H34 O2 S2 |
| SMILES |
C(Cc1ccc(s1)C(=O)CCC(=O)c1ccc(CCCCCC)s1)CCCC |
| Title of publication |
Experimental and theoretical charge-density analysis of 1,4-bis(5-hexyl-2-thienyl)butane-1,4-dione: applications of a virtual-atom model |
| Authors of publication |
Ahmed, Maqsood; Nassour, Ayoub; Noureen, Sajida; Lecomte, Claude; Jelsch, Christian |
| Journal of publication |
Acta Crystallographica Section B |
| Year of publication |
2016 |
| Journal volume |
72 |
| Journal issue |
1 |
| Pages of publication |
75 - 86 |
| a |
5.047 ± 0.005 Å |
| b |
6.979 ± 0.006 Å |
| c |
16.333 ± 0.009 Å |
| α |
98.79 ± 0.16° |
| β |
93.52 ± 0.15° |
| γ |
95.39 ± 0.15° |
| Cell volume |
564.3 ± 0.9 Å3 |
| Cell temperature |
100 ± 1 K |
| Ambient diffraction temperature |
100 ± 1 K |
| Number of distinct elements |
4 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for all reflections |
0.0425 |
| Residual factor for significantly intense reflections |
0.0425 |
| Weighted residual factors for significantly intense reflections |
0.0634 |
| Weighted residual factors for all reflections included in the refinement |
0.0719 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.045 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/2107444.html