Information card for entry 2108802
| Common name |
4'-Iodo-4-nitrochalcone |
| Chemical name |
(2<i>E</i>)-1-(4-Iodophenyl)-3-(4-nitrophenyl)prop-2-en-1-one |
| Formula |
C15 H10 I N O3 |
| Calculated formula |
C15 H10 I N O3 |
| SMILES |
Ic1ccc(C(=O)/C=C/c2ccc(N(=O)=O)cc2)cc1 |
| Title of publication |
Structural effects of halogen bonding in iodochalcones |
| Authors of publication |
Hamilton, Victoria; Harris, Connah; Hall, Charlie L.; Potticary, Jason; Cremeens, Matthew E.; D'Ambruoso, Gemma D.; Matsumoto, Masaomi; Warren, Stephen D.; Pridmore, Natalie E.; Sparkes, Hazel A.; Hall, Simon R. |
| Journal of publication |
Acta Crystallographica Section B |
| Year of publication |
2021 |
| Journal volume |
77 |
| Journal issue |
3 |
| a |
17.9016 ± 0.0007 Å |
| b |
5.8824 ± 0.0002 Å |
| c |
25.4871 ± 0.0009 Å |
| α |
90° |
| β |
94.427 ± 0.002° |
| γ |
90° |
| Cell volume |
2675.9 ± 0.17 Å3 |
| Cell temperature |
100 K |
| Ambient diffraction temperature |
100 K |
| Number of distinct elements |
5 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.0464 |
| Residual factor for significantly intense reflections |
0.0312 |
| Weighted residual factors for significantly intense reflections |
0.0661 |
| Weighted residual factors for all reflections included in the refinement |
0.0717 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.029 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
For the version history of this entry, please navigate to main COD server.
The link is:
https://www.crystallography.net/2108802.html