Information card for entry 2201084

Structure parameters

• Chemical name: Bis(μ-η^2^-benzene-1,2-dithiolato-κ^3^S,S':S')bis[(η^6^-p- cymene)ruthenium(II)]
• Formula: C32 H36 Ru2 S4
• Calculated formula: C32 H36 Ru2 S4
• SMILES: c12ccccc1[S]1[Ru]345678([cH]9[c]3([cH]4[cH]5[c]6([cH]79)C)C(C)C)[S](c3c(cccc3)S8)[Ru]345671([c]1([cH]3[cH]4[c]5([cH]6[cH]71)C(C)C)C)S2
• Title of publication: Bis(μ-η^2^-benzene-1,2-dithiolato-κ^3^<i>S,S</i>':<i>S</i>')bis[(η^6^-<i>p</i>-cymene)ruthenium(II)]
• Authors of publication: Cabeza, Javier A.; García-Granda, Santiago; Pérez-Priede, Monica; Van der Maelen, Juan Francisco
• Journal of publication: Acta Crystallographica Section E
• Year of publication: 2002
• Journal volume: 58
• Journal issue: 5
• Pages of publication: m189 - m190
• a: 8.237 ± 0.005 Å
• b: 9.813 ± 0.006 Å
• c: 10.237 ± 0.003 Å
• α: 65.42 ± 0.04°
• β: 82.57 ± 0.03°
• γ: 76.34 ± 0.06°
• Cell volume: 730.7 ± 0.7 ų
• Cell temperature: 293 ± 2 K
• Ambient diffraction temperature: 293 ± 2 K
• Number of distinct elements: 4
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.095
• Residual factor for significantly intense reflections: 0.041
• Weighted residual factors for significantly intense reflections: 0.089
• Weighted residual factors for all reflections included in the refinement: 0.105
• Goodness-of-fit parameter for all reflections included in the refinement: 1.02
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: No