Information card for entry 2203427
| Chemical name |
[1,2-bis(diphenylphosphino)ethane](2,3-quionoxalinedithiolato)nickel |
| Formula |
C34 H28 N2 Ni P2 S2 |
| Calculated formula |
C34 H28 N2 Ni P2 S2 |
| SMILES |
[Ni]12(Sc3nc4c(nc3S2)cccc4)[P](c2ccccc2)(c2ccccc2)CC[P]1(c1ccccc1)c1ccccc1 |
| Title of publication |
[1,2-Bis(diphenylphosphino)ethane](2,3-quinoxalinedithiolato)nickel(II) |
| Authors of publication |
Ni, Chun-Lin; Li, Yi-Zhi; Ni, Zhao-Ping; Dang, Dong-Bin; Meng, Qin-jing |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2004 |
| Journal volume |
60 |
| Journal issue |
4 |
| Pages of publication |
m410 - m412 |
| a |
11.427 ± 0.001 Å |
| b |
12.947 ± 0.001 Å |
| c |
20.752 ± 0.002 Å |
| α |
90° |
| β |
90° |
| γ |
90° |
| Cell volume |
3070.2 ± 0.5 Å3 |
| Cell temperature |
293 ± 2 K |
| Ambient diffraction temperature |
293 ± 2 K |
| Number of distinct elements |
6 |
| Space group number |
19 |
| Hermann-Mauguin space group symbol |
P 21 21 21 |
| Hall space group symbol |
P 2ac 2ab |
| Residual factor for all reflections |
0.0615 |
| Residual factor for significantly intense reflections |
0.0553 |
| Weighted residual factors for significantly intense reflections |
0.1526 |
| Weighted residual factors for all reflections included in the refinement |
0.1564 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.071 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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