Information card for entry 2203736
| Chemical name |
(R)-2,2'-Dimethoxy-3,3'-bis{[(1S)-1-phenylethyl]iminomethyl}-1,1'- binaphthalene |
| Formula |
C40 H36 N2 O2 |
| Calculated formula |
C40 H36 N2 O2 |
| SMILES |
O(c1c(cc2ccccc2c1c1c2ccccc2cc(c1OC)/C=N/[C@H](c1ccccc1)C)/C=N/[C@H](c1ccccc1)C)C |
| Title of publication |
(<i>R</i>)-2,2'-Dimethoxy-3,3'-bis{[(1<i>S</i>)-1-phenylethyl]iminomethyl}-1,1'-binaphthalene, a new chiral Schiff base |
| Authors of publication |
Li, Xingshu; Jia, Xian; Su, Liming; Zhou, Zhongyuan |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2004 |
| Journal volume |
60 |
| Journal issue |
6 |
| Pages of publication |
o998 - o999 |
| a |
9.614 ± 0.002 Å |
| b |
15.27 ± 0.004 Å |
| c |
22.838 ± 0.005 Å |
| α |
90° |
| β |
90° |
| γ |
90° |
| Cell volume |
3352.8 ± 1.3 Å3 |
| Cell temperature |
294 ± 2 K |
| Ambient diffraction temperature |
294 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
19 |
| Hermann-Mauguin space group symbol |
P 21 21 21 |
| Hall space group symbol |
P 2ac 2ab |
| Residual factor for all reflections |
0.1567 |
| Residual factor for significantly intense reflections |
0.0492 |
| Weighted residual factors for significantly intense reflections |
0.099 |
| Weighted residual factors for all reflections included in the refinement |
0.1182 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.012 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/2203736.html