Information card for entry 2203866
| Chemical name |
[N,N'-Bis(2-oxidonaphthylmethylidene)ethane-1,2-diamine- κ^4^O,N,N',O']copper(II) |
| Formula |
C24 H18 Cu N2 O2 |
| Calculated formula |
C24 H18 Cu N2 O2 |
| SMILES |
[Cu]123Oc4c(c5ccccc5cc4)C=[N]2CC[N]3=Cc2c(ccc3ccccc23)O1 |
| Title of publication |
[<i>N,N</i>'-Bis(2-oxidonaphthylmethylidene)ethane-1,2-diamine-κ^4^<i>O,N,N</i>',<i>O</i>']copper(II) |
| Authors of publication |
Li, Zong-Xiao; Zhang, Xin-Li |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2004 |
| Journal volume |
60 |
| Journal issue |
7 |
| Pages of publication |
m958 - m959 |
| a |
17.644 ± 0.004 Å |
| b |
8.165 ± 0.002 Å |
| c |
12.922 ± 0.003 Å |
| α |
90° |
| β |
99.99 ± 0.03° |
| γ |
90° |
| Cell volume |
1833.4 ± 0.8 Å3 |
| Cell temperature |
293 ± 2 K |
| Ambient diffraction temperature |
293 ± 2 K |
| Number of distinct elements |
5 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.086 |
| Residual factor for significantly intense reflections |
0.0673 |
| Weighted residual factors for significantly intense reflections |
0.145 |
| Weighted residual factors for all reflections included in the refinement |
0.1546 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.149 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/2203866.html