Information card for entry 2204481
| Chemical name |
(S)-(-)-5,5'-Bis(diphenylphosphino)-2,2,2',2'-tetramethyl-4,4'-bi- 1,3-benzodioxole |
| Formula |
C42 H36 O4 P2 |
| Calculated formula |
C42 H36 O4 P2 |
| SMILES |
CC1(C)Oc2c(O1)c(c1c3OC(Oc3ccc1P(c1ccccc1)c1ccccc1)(C)C)c(cc2)P(c1ccccc1)c1ccccc1 |
| Title of publication |
(<i>S</i>)-(–)-5,5'-Bis(diphenylphosphino)-2,2,2',2'-tetramethyl-4,4'-bi-1,3-benzodioxole |
| Authors of publication |
Jiang Cheng; Yan-Hui Sun; Yi Pan; Jian-Hua Xu |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2004 |
| Journal volume |
60 |
| Journal issue |
11 |
| Pages of publication |
o2133 - o2134 |
| a |
9.7007 ± 0.0009 Å |
| b |
20.774 ± 0.002 Å |
| c |
8.9149 ± 0.0009 Å |
| α |
90° |
| β |
90° |
| γ |
90° |
| Cell volume |
1796.6 ± 0.3 Å3 |
| Cell temperature |
298 ± 2 K |
| Ambient diffraction temperature |
298 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
18 |
| Hermann-Mauguin space group symbol |
P 21 21 2 |
| Hall space group symbol |
P 2 2ab |
| Residual factor for all reflections |
0.0394 |
| Residual factor for significantly intense reflections |
0.0345 |
| Weighted residual factors for significantly intense reflections |
0.0789 |
| Weighted residual factors for all reflections included in the refinement |
0.0809 |
| Goodness-of-fit parameter for all reflections included in the refinement |
0.989 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/2204481.html