Information card for entry 2205410
| Chemical name |
(3S,6R)-3-benzyloxymethyl-6-methyl-1,4-dioxane-2,5-dione |
| Formula |
C13 H14 O5 |
| Calculated formula |
C13 H14 O5 |
| SMILES |
O=C1O[C@H](C(=O)O[C@@H]1C)COCc1ccccc1 |
| Title of publication |
(3<i>S</i>,6<i>R</i>)-3-Benzyloxymethyl-6-methyl-1,4-dioxane-2,5-dione |
| Authors of publication |
Kooijman, Huub; Leemhuis, Mark; Nostrum, Cornelus F. van; Hennink, Wim E.; Spek, Anthony L. |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2005 |
| Journal volume |
61 |
| Journal issue |
4 |
| Pages of publication |
o898 - o900 |
| a |
5.289 ± 0.002 Å |
| b |
8.678 ± 0.002 Å |
| c |
13.178 ± 0.005 Å |
| α |
90° |
| β |
96.748 ± 0.012° |
| γ |
90° |
| Cell volume |
600.7 ± 0.4 Å3 |
| Cell temperature |
150 K |
| Ambient diffraction temperature |
150 K |
| Number of distinct elements |
3 |
| Space group number |
4 |
| Hermann-Mauguin space group symbol |
P 1 21 1 |
| Hall space group symbol |
P 2yb |
| Residual factor for all reflections |
0.0378 |
| Residual factor for significantly intense reflections |
0.0309 |
| Weighted residual factors for significantly intense reflections |
0.0732 |
| Weighted residual factors for all reflections included in the refinement |
0.076 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.073 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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