Information card for entry 2207101
| Chemical name |
3,4-Dinitro-N,N,N',N'-tetraphenylthiophene-2,5-diamine |
| Formula |
C28 H20 N4 O4 S |
| Calculated formula |
C28 H20 N4 O4 S |
| SMILES |
s1c(N(c2ccccc2)c2ccccc2)c(N(=O)=O)c(N(=O)=O)c1N(c1ccccc1)c1ccccc1 |
| Title of publication |
3,4-Dinitro-<i>N</i>,<i>N</i>,<i>N</i>',<i>N</i>'-tetraphenylthiophene-2,5-diamine |
| Authors of publication |
Huang, Ping-Hsin; Shen, Jiun-Yi; Chang, Yu-Tang; Wen, Yuh-Sheng; Yeh, Ming-Chang P.; Lin, Jiann T. |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2005 |
| Journal volume |
61 |
| Journal issue |
10 |
| Pages of publication |
o3315 - o3316 |
| a |
9.9075 ± 0.0004 Å |
| b |
19.0621 ± 0.0007 Å |
| c |
13.5418 ± 0.0005 Å |
| α |
90° |
| β |
108.977 ± 0.002° |
| γ |
90° |
| Cell volume |
2418.47 ± 0.16 Å3 |
| Cell temperature |
100 ± 2 K |
| Ambient diffraction temperature |
100 ± 2 K |
| Number of distinct elements |
5 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.0543 |
| Residual factor for significantly intense reflections |
0.0393 |
| Weighted residual factors for significantly intense reflections |
0.0943 |
| Weighted residual factors for all reflections included in the refinement |
0.1006 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.065 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/2207101.html