Information card for entry 2207901
| Chemical name |
(1,4-Diazacycloheptane-κ^2^N,N')(2-thioxo-1,3-dithiole-4,5-dithiolato- κ^2^S^4^,S^5^)nickel(II) |
| Formula |
C8 H12 N2 Ni S5 |
| Calculated formula |
C8 H12 N2 Ni S5 |
| SMILES |
[Ni]12(SC3SC(=S)SC=3S1)[NH]1CCC[NH]2CC1 |
| Title of publication |
(1,4-Diazacycloheptane-κ^2^<i>N</i>,<i>N</i>')(2-thioxo-1,3-dithiole-4,5-dithiolato-κ^2^<i>S</i>^4^,<i>S</i>^5^)nickel(II) |
| Authors of publication |
Yi-Hang Wen; Qi-Wei Zhang |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2006 |
| Journal volume |
62 |
| Journal issue |
1 |
| Pages of publication |
m42 - m44 |
| a |
9.329 ± 0.0019 Å |
| b |
11.997 ± 0.002 Å |
| c |
13.169 ± 0.003 Å |
| α |
65.2 ± 0.03° |
| β |
82.81 ± 0.03° |
| γ |
80.64 ± 0.03° |
| Cell volume |
1317.5 ± 0.6 Å3 |
| Cell temperature |
293 ± 2 K |
| Ambient diffraction temperature |
293 ± 2 K |
| Number of distinct elements |
5 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for significantly intense reflections |
0.0265 |
| Weighted residual factors for significantly intense reflections |
0.0585 |
| Weighted residual factors for all reflections included in the refinement |
0.0743 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.014 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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