Information card for entry 2209779
| Formula |
C34 H46 N2 O6 S4 |
| Calculated formula |
C34 H46 N2 O6 S4 |
| SMILES |
CCCN1Cc2sccc2OCCOCCOc2ccsc2CN(Cc2c(OCCOCCOc3c(C1)scc3)ccs2)CCC |
| Title of publication |
A thiophene-based azacryptand Mannich base: 15,35-dipropyl-2,5,8,22,25,28-hexaoxa-12,18,32,38-tetrathia-15,35-diazapentacyclo[29.5.5.5.0.0]tetraconta-1(37),9(13),10,17(21),19,29(33),30,39-octaene |
| Authors of publication |
Gaël Labat; Joan Halfpenny |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2006 |
| Journal volume |
62 |
| Journal issue |
8 |
| Pages of publication |
o3310 - o3312 |
| a |
6.8178 ± 0.0009 Å |
| b |
9.4311 ± 0.0018 Å |
| c |
13.833 ± 0.002 Å |
| α |
105.69 ± 0.02° |
| β |
92.453 ± 0.018° |
| γ |
98.79 ± 0.02° |
| Cell volume |
842.9 ± 0.3 Å3 |
| Cell temperature |
153 ± 2 K |
| Ambient diffraction temperature |
153 ± 2 K |
| Number of distinct elements |
5 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for all reflections |
0.0384 |
| Residual factor for significantly intense reflections |
0.0283 |
| Weighted residual factors for significantly intense reflections |
0.0688 |
| Weighted residual factors for all reflections included in the refinement |
0.0714 |
| Goodness-of-fit parameter for all reflections included in the refinement |
0.97 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/2209779.html