Information card for entry 2210146
| Chemical name |
Diaqua(ethylenediamine)(N,N,N',N'-tetramethylethylenediamine)nickel(II) dichloride dihydrate |
| Formula |
C8 H32 Cl2 N4 Ni O4 |
| Calculated formula |
C8 H32 Cl2 N4 Ni O4 |
| SMILES |
C1[NH2][Ni]2([N](CC[N]2(C)C)(C)C)([OH2])([NH2]C1)[OH2].O.[Cl-].O.[Cl-] |
| Title of publication |
Diaqua(ethylenediamine)(<i>N</i>,<i>N</i>,<i>N</i>',<i>N</i>'-tetramethylethylenediamine)nickel(II) dichloride dihydrate |
| Authors of publication |
Chen, Zi-Lu; Zhang, Yu-Zhen; Liang, Fu-Pei |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2006 |
| Journal volume |
62 |
| Journal issue |
9 |
| Pages of publication |
m2287 - m2289 |
| a |
15.005 ± 0.004 Å |
| b |
9.591 ± 0.003 Å |
| c |
12.505 ± 0.003 Å |
| α |
90° |
| β |
90° |
| γ |
90° |
| Cell volume |
1799.6 ± 0.9 Å3 |
| Cell temperature |
298 ± 2 K |
| Ambient diffraction temperature |
298 ± 2 K |
| Number of distinct elements |
6 |
| Space group number |
60 |
| Hermann-Mauguin space group symbol |
P b c n |
| Hall space group symbol |
-P 2n 2ab |
| Residual factor for all reflections |
0.0485 |
| Residual factor for significantly intense reflections |
0.0375 |
| Weighted residual factors for significantly intense reflections |
0.0983 |
| Weighted residual factors for all reflections included in the refinement |
0.1123 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.086 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/2210146.html