Information card for entry 2210312
| Chemical name |
Tetrakis(2,3,5,6-tetrafluorobenzenethiolato-κS)(triphenylphosphine- κP)osmium(IV) n-hexane hemisolvate |
| Formula |
C45 H26 F16 Os P S4 |
| Calculated formula |
C45 H26 F16 Os P S4 |
| Title of publication |
Tetrakis(2,3,5,6-tetrafluorobenzenethiolato-κ<i>S</i>)(triphenylphosphine-κ<i>P</i>)osmium(IV) <i>n</i>-hexane hemisolvate |
| Authors of publication |
Cerón, Margarita; Arroyo, Maribel; Bernès, Sylvain |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2006 |
| Journal volume |
62 |
| Journal issue |
9 |
| Pages of publication |
m2167 - m2169 |
| a |
12.209 ± 0.003 Å |
| b |
13.513 ± 0.003 Å |
| c |
13.865 ± 0.003 Å |
| α |
89.2 ± 0.02° |
| β |
87.4 ± 0.02° |
| γ |
86.454 ± 0.015° |
| Cell volume |
2280.6 ± 0.9 Å3 |
| Cell temperature |
296 ± 1 K |
| Ambient diffraction temperature |
296 ± 1 K |
| Number of distinct elements |
6 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for all reflections |
0.0841 |
| Residual factor for significantly intense reflections |
0.0645 |
| Weighted residual factors for significantly intense reflections |
0.1608 |
| Weighted residual factors for all reflections included in the refinement |
0.174 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.045 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
Yes |
| Has Fobs |
Yes |
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https://www.crystallography.net/2210312.html