Information card for entry 2211801
| Chemical name |
(1R,2S,3R,6S,7R,8S)-Tricyclo[6.2.1.0^2,7^]undeca-4,9-diene-3,6-diol |
| Formula |
C11 H14 O2 |
| Calculated formula |
C11 H14 O2 |
| SMILES |
[C@H]1(C=C[C@@H]([C@H]2[C@@H]1[C@@H]1C[C@H]2C=C1)O)O |
| Title of publication |
(1<i>R</i>,2<i>S</i>,3<i>R</i>,6<i>S</i>,7<i>R</i>,8<i>S</i>)-Tricyclo[6.2.1.0^2,7^]undeca-4,9-diene-3,6-diol |
| Authors of publication |
Banister, Samuel D.; Clegg, Jack K.; Coster, Mark J.; Jolliffe, Katrina A.; Kassiou, Michael |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2007 |
| Journal volume |
63 |
| Journal issue |
1 |
| Pages of publication |
o92 - o93 |
| a |
12.5265 ± 0.0015 Å |
| b |
10.7003 ± 0.0013 Å |
| c |
13.9454 ± 0.0013 Å |
| α |
90° |
| β |
90° |
| γ |
90° |
| Cell volume |
1869.2 ± 0.4 Å3 |
| Cell temperature |
150 ± 2 K |
| Ambient diffraction temperature |
150 ± 2 K |
| Number of distinct elements |
3 |
| Space group number |
29 |
| Hermann-Mauguin space group symbol |
P c a 21 |
| Hall space group symbol |
P 2c -2ac |
| Residual factor for all reflections |
0.0736 |
| Residual factor for significantly intense reflections |
0.0516 |
| Weighted residual factors for significantly intense reflections |
0.1089 |
| Weighted residual factors for all reflections included in the refinement |
0.1182 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.027 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/2211801.html