Information card for entry 2212379
| Chemical name |
4-Ethyl-8-methyl-6-phenyl-1-(phenylsulfonyl)- 1H,6H-pyrrolo[3,4-f]indole-5,7(1H,6H)-dione |
| Formula |
C25 H20 N2 O4 S |
| Calculated formula |
C25 H20 N2 O4 S |
| SMILES |
S(=O)(=O)(n1ccc2c(c3C(=O)N(C(=O)c3c(c12)C)c1ccccc1)CC)c1ccccc1 |
| Title of publication |
4-Ethyl-8-methyl-6-phenyl-1-(phenylsulfonyl)-1<i>H</i>,6<i>H</i>-pyrrolo[3,4-<i>f</i>]indole-5,7(1<i>H</i>,6<i>H</i>)-dione |
| Authors of publication |
Moskalev, Nikolai V.; Gribble, Gordon W.; Jasinski, Jerry P. |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2007 |
| Journal volume |
63 |
| Journal issue |
2 |
| Pages of publication |
o673 - o674 |
| a |
19.751 ± 0.004 Å |
| b |
12.534 ± 0.005 Å |
| c |
17.747 ± 0.004 Å |
| α |
90° |
| β |
105.82 ± 0.017° |
| γ |
90° |
| Cell volume |
4227 ± 2 Å3 |
| Cell temperature |
296 ± 2 K |
| Ambient diffraction temperature |
296 K |
| Number of distinct elements |
5 |
| Space group number |
15 |
| Hermann-Mauguin space group symbol |
C 1 2/c 1 |
| Hall space group symbol |
-C 2yc |
| Residual factor for all reflections |
0.266 |
| Residual factor for significantly intense reflections |
0.055 |
| Weighted residual factors for significantly intense reflections |
0.134 |
| Weighted residual factors for all reflections included in the refinement |
0.204 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1 |
| Diffraction radiation wavelength |
0.71069 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/2212379.html