Information card for entry 2214969
| Chemical name |
5,5'-Dimethyl-2,2'-[p-phenylenebis(methylenethio)]bis(4,5-dihydrothiazole) |
| Formula |
C16 H20 N2 S4 |
| Calculated formula |
C16 H20 N2 S4 |
| SMILES |
C[C@@H]1CN=C(S1)SCc1ccc(cc1)CSC1=NC[C@@H](S1)C.C[C@H]1CN=C(S1)SCc1ccc(cc1)CSC1=NC[C@H](S1)C |
| Title of publication |
5,5'-Dimethyl-2,2'-[<i>p</i>-phenylenebis(methylenethio)]bis(4,5-dihydrothiazole) |
| Authors of publication |
Zhou, Xi-Fei; Hai-Jun Chi; Liang, Dong; Sun, Dong-Mei; Wang, Wei |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2007 |
| Journal volume |
63 |
| Journal issue |
9 |
| Pages of publication |
o3864 - o3864 |
| a |
6.9337 ± 0.0008 Å |
| b |
16.133 ± 0.002 Å |
| c |
8.2475 ± 0.001 Å |
| α |
90° |
| β |
99.519 ± 0.006° |
| γ |
90° |
| Cell volume |
909.87 ± 0.19 Å3 |
| Cell temperature |
294 ± 2 K |
| Ambient diffraction temperature |
294 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.0739 |
| Residual factor for significantly intense reflections |
0.0497 |
| Weighted residual factors for significantly intense reflections |
0.1228 |
| Weighted residual factors for all reflections included in the refinement |
0.1345 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.054 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/2214969.html