Information card for entry 2215572
| Chemical name |
3,3',4,4'-Tetrabutyl-5,5'-(biphenyl-4,4'-diyldiethynyl)bis(thiophene-2-\ carbonitrile) |
| Formula |
C42 H44 N2 S2 |
| Calculated formula |
C42 H44 N2 S2 |
| SMILES |
CCCCc1c(C#Cc2ccc(cc2)c2ccc(cc2)C#Cc2sc(c(c2CCCC)CCCC)C#N)sc(c1CCCC)C#N |
| Title of publication |
3,3',4,4'-Tetrabutyl-5,5'-(biphenyl-4,4'-diyldiethynyl)bis(thiophene-2-carbonitrile) |
| Authors of publication |
Lei Liu; Wei Xu; Xun-Wen Xiao; Dao-Ben Zhu |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2007 |
| Journal volume |
63 |
| Journal issue |
10 |
| Pages of publication |
o3961 - o3961 |
| a |
8.1428 ± 0.0016 Å |
| b |
9.1856 ± 0.0018 Å |
| c |
13.606 ± 0.003 Å |
| α |
90.37 ± 0.03° |
| β |
100.53 ± 0.03° |
| γ |
112.32 ± 0.03° |
| Cell volume |
922.4 ± 0.4 Å3 |
| Cell temperature |
293 ± 2 K |
| Ambient diffraction temperature |
293 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for all reflections |
0.0851 |
| Residual factor for significantly intense reflections |
0.0711 |
| Weighted residual factors for significantly intense reflections |
0.2178 |
| Weighted residual factors for all reflections included in the refinement |
0.2354 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.013 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
No |
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The link is:
https://www.crystallography.net/2215572.html