Information card for entry 2215734

Structure parameters

• Formula: C96 H70 N4 O12 Yb2
• Calculated formula: C96 H70 N4 O12 Yb2
• SMILES: C1(Cc2cccc3c2cccc3)[O]2[Yb]3456([n]7cccc8c7c7[n]4cccc7cc8)([O]=1)([O]=C(Cc1cccc4c1cccc4)O[Yb]1472([O]=C(Cc2cccc8c2cccc8)[O]34)([n]2cccc3c2c2[n]1cccc2cc3)([O]=C(O6)Cc1cccc2c1cccc2)[O]=C(O7)Cc1cccc2c1cccc2)[O]=C(O5)Cc1cccc2c1cccc2
• Title of publication: Tetrakis(μ-naphthalene-1-acetato)bis[(naphthalene-1-acetato)(1,10-phenanthroline)ytterbium(III)]
• Authors of publication: Xia, Hai-Tao; Liu, Yu-Fen; Wang, Da-Qi; Yang, Shu-Ping
• Journal of publication: Acta Crystallographica Section E
• Year of publication: 2007
• Journal volume: 63
• Journal issue: 11
• Pages of publication: m2795 - m2796
• a: 12.364 ± 0.001 Å
• b: 13.5622 ± 0.0012 Å
• c: 13.5954 ± 0.0013 Å
• α: 114.189 ± 0.003°
• β: 99.559 ± 0.002°
• γ: 103.485 ± 0.002°
• Cell volume: 1932.3 ± 0.3 ų
• Cell temperature: 298 ± 2 K
• Ambient diffraction temperature: 298 ± 2 K
• Number of distinct elements: 5
• Space group number: 2
• Hermann-Mauguin space group symbol: P -1
• Hall space group symbol: -P 1
• Residual factor for all reflections: 0.0456
• Residual factor for significantly intense reflections: 0.0314
• Weighted residual factors for significantly intense reflections: 0.0745
• Weighted residual factors for all reflections included in the refinement: 0.0892
• Goodness-of-fit parameter for all reflections included in the refinement: 1.011
• Diffraction radiation wavelength: 0.71073 Å
• Diffraction radiation type: MoKα
• Has coordinates: Yes
• Has disorder: No
• Has Fobs: Yes