Information card for entry 2216128
| Chemical name |
2,3,5',6,6',7-Hexamethoxy-3'H,10H-spiro[anthracene-9,1'-isobenzofuran]- 3',10-dione |
| Formula |
C27 H24 O9 |
| Calculated formula |
C27 H24 O9 |
| SMILES |
c12cc(c(cc1C(=O)c1cc(c(cc1C12c2cc(c(cc2C(=O)O1)OC)OC)OC)OC)OC)OC |
| Title of publication |
2,3,5',6,6',7-Hexamethoxy-3'<i>H</i>,10<i>H</i>-spiro[anthracene-9,1'-isobenzofuran]-3',10-dione |
| Authors of publication |
Marlon R. Lutz Jr; Matthias Zeller; Daniel P. Becker |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2007 |
| Journal volume |
63 |
| Journal issue |
11 |
| Pages of publication |
o4390 - o4391 |
| a |
13.1371 ± 0.0007 Å |
| b |
13.3281 ± 0.0007 Å |
| c |
16.6587 ± 0.0009 Å |
| α |
90° |
| β |
107.043 ± 0.001° |
| γ |
90° |
| Cell volume |
2788.7 ± 0.3 Å3 |
| Cell temperature |
298 ± 2 K |
| Ambient diffraction temperature |
298 ± 2 K |
| Number of distinct elements |
3 |
| Space group number |
13 |
| Hermann-Mauguin space group symbol |
P 1 2/n 1 |
| Hall space group symbol |
-P 2yac |
| Residual factor for all reflections |
0.0673 |
| Residual factor for significantly intense reflections |
0.0562 |
| Weighted residual factors for significantly intense reflections |
0.1681 |
| Weighted residual factors for all reflections included in the refinement |
0.1787 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.079 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/2216128.html