Information card for entry 2217659
| Chemical name |
Bis(acetato-κO)[N,N,N',N'-tetramethylethane-1,2-diamine-κ^2^N,N']copper(II) |
| Formula |
C10 H22 Cu N2 O4 |
| Calculated formula |
C10 H22 Cu N2 O4 |
| SMILES |
[Cu]123([N](CC[N]1(C)C)(C)C)(OC(=[O]2)C)OC(=[O]3)C |
| Title of publication |
Bis(acetato-κ<i>O</i>)[<i>N</i>,<i>N</i>,<i>N</i>',<i>N</i>'-tetramethylethane-1,2-diamine-κ^2^<i>N</i>,<i>N</i>']copper(II) |
| Authors of publication |
Slootweg, J. Chris; Chen, Peter |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2008 |
| Journal volume |
64 |
| Journal issue |
2 |
| Pages of publication |
m430 - m431 |
| a |
8.0201 ± 0.0005 Å |
| b |
15.9153 ± 0.001 Å |
| c |
10.8536 ± 0.0007 Å |
| α |
90° |
| β |
90.91 ± 0.003° |
| γ |
90° |
| Cell volume |
1385.2 ± 0.15 Å3 |
| Cell temperature |
220 ± 2 K |
| Ambient diffraction temperature |
220 ± 2 K |
| Number of distinct elements |
5 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/n 1 |
| Hall space group symbol |
-P 2yn |
| Residual factor for all reflections |
0.0493 |
| Residual factor for significantly intense reflections |
0.0398 |
| Weighted residual factors for significantly intense reflections |
0.1002 |
| Weighted residual factors for all reflections included in the refinement |
0.1064 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.055 |
| Diffraction radiation wavelength |
0.7107 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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The link is:
https://www.crystallography.net/2217659.html