Information card for entry 2218681
| Common name |
roxburghin tetramethyl ether |
| Chemical name |
(<i>E</i>)-2,3',4,5-tetramethoxystilbene |
| Formula |
C18 H20 O4 |
| Calculated formula |
C18 H20 O4 |
| SMILES |
O(c1c(OC)cc(OC)c(c1)/C=C/c1cc(OC)ccc1)C |
| Title of publication |
Semisynthetic roxburghin tetramethyl ether |
| Authors of publication |
Saez, Alex; Ramirez de Arellano, Carmen; El Aouad, Noureddine; Rodriguez, Silvia; Otalvaro, Felipe; Cortes, Diego; Saez, Jairo |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2008 |
| Journal volume |
64 |
| Journal issue |
7 |
| Pages of publication |
o1305 |
| a |
7.9633 ± 0.0004 Å |
| b |
9.2454 ± 0.0005 Å |
| c |
11.6194 ± 0.0005 Å |
| α |
73.4 ± 0.002° |
| β |
75.479 ± 0.003° |
| γ |
70.335 ± 0.002° |
| Cell volume |
760.59 ± 0.07 Å3 |
| Cell temperature |
150 ± 2 K |
| Ambient diffraction temperature |
150 ± 2 K |
| Number of distinct elements |
3 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for all reflections |
0.082 |
| Residual factor for significantly intense reflections |
0.0472 |
| Weighted residual factors for significantly intense reflections |
0.1216 |
| Weighted residual factors for all reflections included in the refinement |
0.136 |
| Goodness-of-fit parameter for all reflections included in the refinement |
0.982 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/2218681.html