Information card for entry 2219164
| Chemical name |
Diethyl [2,2,2-trifluoro-1-phenylsulfonylamino-1-(trifluoromethyl)ethyl]phosphonate |
| Formula |
C13 H16 F6 N O5 P S |
| Calculated formula |
C13 H16 F6 N O5 P S |
| SMILES |
P(=O)(C(NS(=O)(=O)c1ccccc1)(C(F)(F)F)C(F)(F)F)(OCC)OCC |
| Title of publication |
Diethyl [2,2,2-trifluoro-1-phenylsulfonylamino-1-(trifluoromethyl)ethyl]phosphonate |
| Authors of publication |
Wijeyesakere, Sanjeeva J.; Nasser, Faik A.; Kampf, Jeff W.; Aksinenko, Alexey Y.; Sokolov, Vladimir B.; Malygin, Vladimir V.; Makhaeva, Galina F.; Richardson, Rudy J. |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2008 |
| Journal volume |
64 |
| Journal issue |
8 |
| Pages of publication |
o1425 |
| a |
11.6913 ± 0.0015 Å |
| b |
10.1375 ± 0.0013 Å |
| c |
15.5955 ± 0.0019 Å |
| α |
90° |
| β |
93.264 ± 0.002° |
| γ |
90° |
| Cell volume |
1845.4 ± 0.4 Å3 |
| Cell temperature |
113 ± 2 K |
| Ambient diffraction temperature |
113 ± 2 K |
| Number of distinct elements |
7 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/n 1 |
| Hall space group symbol |
-P 2yn |
| Residual factor for all reflections |
0.0342 |
| Residual factor for significantly intense reflections |
0.029 |
| Weighted residual factors for all reflections included in the refinement |
0.0821 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.0335 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/2219164.html