Information card for entry 2219336
| Chemical name |
Tetraethyl 2,2'-(2,3,5,6-tetrafluoro-<i>p</i>-phenylenedimethylene)dipropanoate |
| Formula |
C22 H26 F4 O8 |
| Calculated formula |
C22 H26 F4 O8 |
| SMILES |
CCOC(=O)C(C(=O)OCC)Cc1c(F)c(F)c(c(c1F)F)CC(C(=O)OCC)C(=O)OCC |
| Title of publication |
Tetraethyl 2,2'-(2,3,5,6-tetrafluoro-<i>p</i>-phenylenedimethylene)dipropanoate |
| Authors of publication |
Xi, Haitao; Gao, Yajun; Sun, Xiaoqiang; Meng, Qi; Jiang, Yan |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2008 |
| Journal volume |
64 |
| Journal issue |
9 |
| Pages of publication |
o1853 |
| a |
9.833 ± 0.005 Å |
| b |
8.797 ± 0.004 Å |
| c |
27.587 ± 0.014 Å |
| α |
90° |
| β |
90° |
| γ |
90° |
| Cell volume |
2386 ± 2 Å3 |
| Cell temperature |
291 ± 2 K |
| Ambient diffraction temperature |
291 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
61 |
| Hermann-Mauguin space group symbol |
P b c a |
| Hall space group symbol |
-P 2ac 2ab |
| Residual factor for all reflections |
0.1032 |
| Residual factor for significantly intense reflections |
0.0549 |
| Weighted residual factors for significantly intense reflections |
0.0899 |
| Weighted residual factors for all reflections included in the refinement |
0.097 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.018 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/2219336.html