Information card for entry 2220219
| Common name |
thiopyran-4-one 1-oxide |
| Chemical name |
2-r-(4-Chlorophenyl)-6-c-phenyl-3,4,5,6-tetrahydro-2<i>H</i>-thiopyran-4-one 1-oxide |
| Formula |
C17 H15 Cl O2 S |
| Calculated formula |
C17 H15 Cl O2 S |
| Title of publication |
2-<i>r</i>-(4-Chlorophenyl)-6-<i>c</i>-phenyl-3,4,5,6-tetrahydro-2<i>H</i>-thiopyran-4-one 1-oxide |
| Authors of publication |
Thiruvalluvar, A.; Balamurugan, S.; Butcher, R. J.; Pandiarajan, K.; Devanathan, D. |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2008 |
| Journal volume |
64 |
| Journal issue |
12 |
| Pages of publication |
o2367 |
| a |
11.5195 ± 0.0005 Å |
| b |
25.7589 ± 0.0012 Å |
| c |
5.2248 ± 0.0002 Å |
| α |
90° |
| β |
90° |
| γ |
90° |
| Cell volume |
1550.35 ± 0.12 Å3 |
| Cell temperature |
296 ± 2 K |
| Ambient diffraction temperature |
296 ± 2 K |
| Number of distinct elements |
5 |
| Space group number |
62 |
| Hermann-Mauguin space group symbol |
P n m a |
| Hall space group symbol |
-P 2ac 2n |
| Residual factor for all reflections |
0.0806 |
| Residual factor for significantly intense reflections |
0.0605 |
| Weighted residual factors for significantly intense reflections |
0.184 |
| Weighted residual factors for all reflections included in the refinement |
0.2113 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.203 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/2220219.html