Information card for entry 2220672
| Chemical name |
Bis{6,6'-dimethoxy-2,2'-[ethane-1,2-diylbis(iminomethylene)]diphenolato(1.5-)- κ^4^<i>O</i>,<i>N</i>,<i>N</i>',<i>O</i>'}terbium(III) |
| Formula |
C36 H45 N4 O8 Tb |
| Calculated formula |
C36 H45 N4 O8 Tb |
| Title of publication |
Bis{6,6'-dimethoxy-2,2'-[ethane-1,2-diylbis(iminomethylene)]diphenolato(1.5{-})-κ^4^<i>O</i>,<i>N</i>,<i>N</i>',<i>O</i>'}terbium(III) |
| Authors of publication |
Xia, Hai-Tao; Liu, Yu-Fen; Yang, Shu-Ping; Wang, Da-Qi |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2009 |
| Journal volume |
65 |
| Journal issue |
2 |
| Pages of publication |
m201 |
| a |
21.885 ± 0.002 Å |
| b |
11.1407 ± 0.001 Å |
| c |
14.0928 ± 0.0014 Å |
| α |
90° |
| β |
90° |
| γ |
90° |
| Cell volume |
3436 ± 0.6 Å3 |
| Cell temperature |
298 ± 2 K |
| Ambient diffraction temperature |
298 ± 2 K |
| Number of distinct elements |
5 |
| Space group number |
45 |
| Hermann-Mauguin space group symbol |
I b a 2 |
| Hall space group symbol |
I 2 -2c |
| Residual factor for all reflections |
0.0763 |
| Residual factor for significantly intense reflections |
0.0439 |
| Weighted residual factors for significantly intense reflections |
0.1001 |
| Weighted residual factors for all reflections included in the refinement |
0.1255 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.075 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/2220672.html