Information card for entry 2221197
| Common name |
4-ethynyl-2,2,6,6-tetramethyl-1-oxyl-3,4-dehydropiperidine |
| Chemical name |
4-Ethynyl-2,2,6,6-tetramethyl-1,2,5,6-tetrahydropyridine <i>N</i>-oxide |
| Formula |
C11 H16 N O |
| Calculated formula |
C11 H16 N O |
| SMILES |
O=[N]1C(C=C(CC1(C)C)C#C)(C)C |
| Title of publication |
4-Ethynyl-2,2,6,6-tetramethyl-1,2,5,6-tetrahydropyridine <i>N</i>-oxide |
| Authors of publication |
Bats, Jan W.; Frolow, Olga; Engels, Joachim W. |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2009 |
| Journal volume |
65 |
| Journal issue |
3 |
| Pages of publication |
o529 |
| a |
6.0996 ± 0.0009 Å |
| b |
20.8 ± 0.003 Å |
| c |
8.3662 ± 0.0013 Å |
| α |
90° |
| β |
97.434 ± 0.01° |
| γ |
90° |
| Cell volume |
1052.5 ± 0.3 Å3 |
| Cell temperature |
167 ± 2 K |
| Ambient diffraction temperature |
167 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.0471 |
| Residual factor for significantly intense reflections |
0.0402 |
| Weighted residual factors for significantly intense reflections |
0.1068 |
| Weighted residual factors for all reflections included in the refinement |
0.1117 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.086 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/2221197.html