Information card for entry 2221255
| Chemical name |
3,3,6,6-Tetramethyl-9-phenyl-3,4,5,6-tetrahydro-9<i>H</i>-xanthene- 1,8(2<i>H</i>,7<i>H</i>)-dione |
| Formula |
C23 H26 O3 |
| Calculated formula |
C23 H26 O3 |
| SMILES |
C12=C(C(C3=C(CC(CC3=O)(C)C)O2)c2ccccc2)C(=O)CC(C1)(C)C |
| Title of publication |
3,3,6,6-Tetramethyl-9-phenyl-3,4,5,6-tetrahydro-9<i>H</i>-xanthene-1,8(2<i>H</i>,7<i>H</i>)-dione |
| Authors of publication |
Reddy, B. Palakshi; Vijayakumar, V.; Narasimhamurthy, T.; Suresh, J.; Lakshman, P. L. Nilantha |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2009 |
| Journal volume |
65 |
| Journal issue |
4 |
| Pages of publication |
o916 |
| a |
6.0562 ± 0.0005 Å |
| b |
19.768 ± 0.0018 Å |
| c |
16.4325 ± 0.0013 Å |
| α |
90° |
| β |
97.924 ± 0.003° |
| γ |
90° |
| Cell volume |
1948.5 ± 0.3 Å3 |
| Cell temperature |
293 ± 2 K |
| Ambient diffraction temperature |
293 ± 2 K |
| Number of distinct elements |
3 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.0801 |
| Residual factor for significantly intense reflections |
0.0495 |
| Weighted residual factors for significantly intense reflections |
0.121 |
| Weighted residual factors for all reflections included in the refinement |
0.1379 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.034 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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The link is:
https://www.crystallography.net/2221255.html