Information card for entry 2222333
| Chemical name |
2,2',4,4'-Tetramethyl-7,7'-diazenediylbis(1,8-naphthyridin-1-ium) bis(perchlorate) |
| Formula |
C20 H20 Cl2 N6 O8 |
| Calculated formula |
C20 H20 Cl2 N6 O8 |
| SMILES |
Cc1cc(c2c([nH+]1)nc(N=Nc1ccc3c(cc(C)[nH+]c3n1)C)cc2)C.[O-]Cl(=O)(=O)=O.[O-]Cl(=O)(=O)=O |
| Title of publication |
2,2',4,4'-Tetramethyl-7,7'-diazenediylbis(1,8-naphthyridin-1-ium) bis(perchlorate) |
| Authors of publication |
Mo, Juan; Yuan, Li; Liu, Jian-Hua; Chen, Wen; Li, Xin-Sheng |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2009 |
| Journal volume |
65 |
| Journal issue |
7 |
| Pages of publication |
o1500 |
| a |
8.2008 ± 0.0016 Å |
| b |
13.042 ± 0.003 Å |
| c |
11.133 ± 0.002 Å |
| α |
90° |
| β |
102.63 ± 0.03° |
| γ |
90° |
| Cell volume |
1161.9 ± 0.4 Å3 |
| Cell temperature |
113 ± 2 K |
| Ambient diffraction temperature |
113 ± 2 K |
| Number of distinct elements |
5 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/n 1 |
| Hall space group symbol |
-P 2yn |
| Residual factor for all reflections |
0.0534 |
| Residual factor for significantly intense reflections |
0.045 |
| Weighted residual factors for significantly intense reflections |
0.1182 |
| Weighted residual factors for all reflections included in the refinement |
0.1234 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.058 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/2222333.html