Information card for entry 2222914
| Common name |
(R,R)-di-synephrine ether di-hydrogen sulfate |
| Chemical name |
(<i>R</i>,<i>R</i>)-2,4-bis(4-hydroxyphenyl)-<i>N</i>,<i>N</i>'-dimethyl- 3-oxapentane-1,5-diammonium bis(hydrogen sulfate) |
| Formula |
C18 H28 N2 O11 S2 |
| Calculated formula |
C18 H28 N2 O11 S2 |
| Title of publication |
(<i>R</i>,<i>R</i>)-Disynephrine ether bis(hydrogen sulfate) |
| Authors of publication |
Arbuckle, William; Kennedy, Alan R.; Morrison, Catriona A. |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2009 |
| Journal volume |
65 |
| Journal issue |
8 |
| Pages of publication |
o1768 - o1769 |
| a |
13.7204 ± 0.0009 Å |
| b |
11.5853 ± 0.0005 Å |
| c |
7.6579 ± 0.0005 Å |
| α |
90° |
| β |
116.413 ± 0.008° |
| γ |
90° |
| Cell volume |
1090.19 ± 0.13 Å3 |
| Cell temperature |
123 ± 2 K |
| Ambient diffraction temperature |
123 ± 2 K |
| Number of distinct elements |
5 |
| Space group number |
5 |
| Hermann-Mauguin space group symbol |
C 1 2 1 |
| Hall space group symbol |
C 2y |
| Residual factor for all reflections |
0.0543 |
| Residual factor for significantly intense reflections |
0.0434 |
| Weighted residual factors for significantly intense reflections |
0.1077 |
| Weighted residual factors for all reflections included in the refinement |
0.1112 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.03 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/2222914.html