Information card for entry 2223302
| Chemical name |
Diethyl 3,4-bis-(acetoxymethyl)thieno[2,3-<i>b</i>]thiophene-2,5-dicarboxylate |
| Formula |
C18 H20 O8 S2 |
| Calculated formula |
C18 H20 O8 S2 |
| SMILES |
CCOC(=O)c1sc2c(c1COC(=O)C)c(c(s2)C(=O)OCC)COC(=O)C |
| Title of publication |
Diethyl 3,4-bis(acetoxymethyl)thieno[2,3-<i>b</i>]thiophene-2,5-dicarboxylate |
| Authors of publication |
Gunasekaran, B.; Sureshbabu, R.; Mohanakrishnan, A. K.; Chakkaravarthi, G.; Manivannan, V. |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2009 |
| Journal volume |
65 |
| Journal issue |
10 |
| Pages of publication |
o2455 |
| a |
9.3214 ± 0.0005 Å |
| b |
10.2416 ± 0.0006 Å |
| c |
10.6622 ± 0.0006 Å |
| α |
84.952 ± 0.003° |
| β |
82.814 ± 0.004° |
| γ |
75.432 ± 0.003° |
| Cell volume |
975.72 ± 0.1 Å3 |
| Cell temperature |
295 ± 2 K |
| Ambient diffraction temperature |
295 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for all reflections |
0.0893 |
| Residual factor for significantly intense reflections |
0.0572 |
| Weighted residual factors for significantly intense reflections |
0.1602 |
| Weighted residual factors for all reflections included in the refinement |
0.1883 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.041 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
Yes |
| Has Fobs |
Yes |
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https://www.crystallography.net/2223302.html