Information card for entry 2225328
| Chemical name |
(1<i>E</i>,3<i>E</i>,5<i>E</i>,7<i>E</i>)-4,4'-(Octa-1,3,5,7-tetraene-1,8-diyl)dipyridine |
| Formula |
C18 H16 N2 |
| Calculated formula |
C18 H16 N2 |
| SMILES |
C(=C\C=C\c1ccncc1)/C=C/C=C/c1ccncc1 |
| Title of publication |
(1<i>E</i>,3<i>E</i>,5<i>E</i>,7<i>E</i>)-4,4'-(Octa-1,3,5,7-tetraene-1,8-diyl)dipyridine |
| Authors of publication |
Arshad, Muhammad Nadeem; Bader, Mamoun M.; Pham, Phuong-Truc T.; Holman, K. Travis |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2010 |
| Journal volume |
66 |
| Journal issue |
3 |
| Pages of publication |
o508 |
| a |
5.5565 ± 0.0012 Å |
| b |
17.95 ± 0.004 Å |
| c |
21.542 ± 0.005 Å |
| α |
90° |
| β |
94.809 ± 0.005° |
| γ |
90° |
| Cell volume |
2141 ± 0.8 Å3 |
| Cell temperature |
173 ± 2 K |
| Ambient diffraction temperature |
173 ± 2 K |
| Number of distinct elements |
3 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.1331 |
| Residual factor for significantly intense reflections |
0.0452 |
| Weighted residual factors for significantly intense reflections |
0.0801 |
| Weighted residual factors for all reflections included in the refinement |
0.1018 |
| Goodness-of-fit parameter for all reflections included in the refinement |
0.869 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/2225328.html