Information card for entry 2225459
| Chemical name |
1-(Phenylsulfonyl)benzo[1,2:2',3']thieno[5',4'-<i>b</i>]carbazole |
| Formula |
C24 H15 N O2 S2 |
| Calculated formula |
C24 H15 N O2 S2 |
| SMILES |
c1cccc2c1c1c(cc3c(c1)c1ccccc1s3)n2S(=O)(=O)c1ccccc1 |
| Title of publication |
1-(Phenylsulfonyl)benzo[1,2:2',3']thieno[5',4'-<i>b</i>]carbazole |
| Authors of publication |
Thenmozhi, S.; SubbiahPandi, A.; Dhayalan, V.; MohanaKrishnan, A. K. |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2010 |
| Journal volume |
66 |
| Journal issue |
4 |
| Pages of publication |
o954 |
| a |
7.463 ± 0.005 Å |
| b |
10.462 ± 0.005 Å |
| c |
12.335 ± 0.005 Å |
| α |
80.438 ± 0.005° |
| β |
89.433 ± 0.005° |
| γ |
81.876 ± 0.005° |
| Cell volume |
940.1 ± 0.9 Å3 |
| Cell temperature |
293 ± 2 K |
| Ambient diffraction temperature |
293 ± 2 K |
| Number of distinct elements |
5 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for all reflections |
0.0752 |
| Residual factor for significantly intense reflections |
0.0569 |
| Weighted residual factors for significantly intense reflections |
0.1712 |
| Weighted residual factors for all reflections included in the refinement |
0.1916 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.012 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/2225459.html