Information card for entry 2226109
| Chemical name |
(2<i>E</i>,4<i>E</i>)-1-(6-Chloro-2-methyl-4-phenyl-3-quinolyl)- 5-phenylpenta-2,4-dien-1-one |
| Formula |
C27 H20 Cl N O |
| Calculated formula |
C27 H20 Cl N O |
| SMILES |
Clc1ccc2nc(c(c(c2c1)c1ccccc1)C(=O)/C=C/C=C/c1ccccc1)C |
| Title of publication |
(2<i>E</i>,4<i>E</i>)-1-(6-Chloro-2-methyl-4-phenyl-3-quinolyl)-5-phenylpenta-2,4-dien-1-one |
| Authors of publication |
Loh, Wan-Sin; Fun, Hoong-Kun; Viji, A. J.; Sarveswari, S.; Vijayakumar, V. |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2010 |
| Journal volume |
66 |
| Journal issue |
6 |
| Pages of publication |
o1321 |
| a |
6.2464 ± 0.0003 Å |
| b |
22.5672 ± 0.0011 Å |
| c |
15.2748 ± 0.0007 Å |
| α |
90° |
| β |
94.62 ± 0.001° |
| γ |
90° |
| Cell volume |
2146.2 ± 0.18 Å3 |
| Cell temperature |
100 ± 0.1 K |
| Ambient diffraction temperature |
100 ± 0.1 K |
| Number of distinct elements |
5 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.0553 |
| Residual factor for significantly intense reflections |
0.0403 |
| Weighted residual factors for significantly intense reflections |
0.1039 |
| Weighted residual factors for all reflections included in the refinement |
0.1157 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.028 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/2226109.html