Information card for entry 2229896
| Chemical name |
4,4',5,5'-Tetrakis(benzylsulfanyl)tetrathiafulvalene |
| Formula |
C34 H28 S8 |
| Calculated formula |
C34 H28 S8 |
| SMILES |
c1ccc(cc1)CSC1=C(SCc2ccccc2)SC(=C2SC(=C(S2)SCc2ccccc2)SCc2ccccc2)S1 |
| Title of publication |
4,4',5,5'-Tetrakis(benzylsulfanyl)tetrathiafulvalene |
| Authors of publication |
Yu, Cheng-Xiang; Zhu, Yu-Lan; Chen, Zhao-Xiang; Lu, Ming-Zhu; Wang, Kun |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2011 |
| Journal volume |
67 |
| Journal issue |
4 |
| Pages of publication |
o821 |
| a |
5.745 ± 0.0007 Å |
| b |
17.052 ± 0.002 Å |
| c |
18.701 ± 0.003 Å |
| α |
115.199 ± 0.002° |
| β |
95.238 ± 0.002° |
| γ |
95.922 ± 0.002° |
| Cell volume |
1630.1 ± 0.4 Å3 |
| Cell temperature |
296 ± 2 K |
| Ambient diffraction temperature |
296 ± 2 K |
| Number of distinct elements |
3 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for all reflections |
0.0911 |
| Residual factor for significantly intense reflections |
0.0482 |
| Weighted residual factors for significantly intense reflections |
0.1215 |
| Weighted residual factors for all reflections included in the refinement |
0.1569 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.064 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/2229896.html