Information card for entry 2229920
| Chemical name |
(3<i>R</i>,4<i>S</i>)-3,4-Isopropylidenedioxy-5-phenylsulfonylmethyl- 3,4-dihydro-2<i>H</i>-pyrrole 1-oxide |
| Formula |
C14 H17 N O5 S |
| Calculated formula |
C14 H17 N O5 S |
| SMILES |
S(=O)(=O)(CC1=N(=O)C[C@H]2OC(O[C@@H]12)(C)C)c1ccccc1 |
| Title of publication |
(3<i>R</i>,4<i>S</i>)-3,4-Isopropylidenedioxy-5-phenylsulfonylmethyl-3,4-dihydro-2<i>H</i>-pyrrole 1-oxide |
| Authors of publication |
Flores, Mari Fe; Garcia, P.; M. Garrido, Narciso; Sanz, Francisca; Diez, David |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2011 |
| Journal volume |
67 |
| Journal issue |
5 |
| Pages of publication |
o1115 |
| a |
5.6424 ± 0.0002 Å |
| b |
15.5592 ± 0.0007 Å |
| c |
16.9097 ± 0.0008 Å |
| α |
90° |
| β |
90° |
| γ |
90° |
| Cell volume |
1484.52 ± 0.11 Å3 |
| Cell temperature |
298 ± 2 K |
| Ambient diffraction temperature |
298 ± 2 K |
| Number of distinct elements |
5 |
| Space group number |
19 |
| Hermann-Mauguin space group symbol |
P 21 21 21 |
| Hall space group symbol |
P 2ac 2ab |
| Residual factor for all reflections |
0.0428 |
| Residual factor for significantly intense reflections |
0.0344 |
| Weighted residual factors for significantly intense reflections |
0.0787 |
| Weighted residual factors for all reflections included in the refinement |
0.0835 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.059 |
| Diffraction radiation wavelength |
1.54178 Å |
| Diffraction radiation type |
CuKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/2229920.html