Information card for entry 2231090
| Chemical name |
4,7,13,18-Tetraoxa-1,10-diazoniabicyclo[8.5.5]icosane bis(hexafluoridophosphate) |
| Formula |
C14 H30 F12 N2 O4 P2 |
| Calculated formula |
C14 H30 F12 N2 O4 P2 |
| SMILES |
C1COCCOCC[NH+]2CCOCC[NH+]1CCOCC2.[P](F)(F)(F)(F)(F)[F-].[P](F)(F)(F)(F)(F)[F-] |
| Title of publication |
4,7,13,18-Tetraoxa-1,10-diazoniabicyclo[8.5.5]icosane bis(hexafluoridophosphate) |
| Authors of publication |
Sen Gupta, Nalinava; Wragg, David S.; Tilset, Mats; Omtvedt, Jon Petter |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2011 |
| Journal volume |
67 |
| Journal issue |
8 |
| Pages of publication |
o1929 - o1930 |
| a |
10.8297 ± 0.0016 Å |
| b |
16.485 ± 0.002 Å |
| c |
12.6846 ± 0.0019 Å |
| α |
90° |
| β |
95.538 ± 0.002° |
| γ |
90° |
| Cell volume |
2254 ± 0.5 Å3 |
| Cell temperature |
296 ± 2 K |
| Ambient diffraction temperature |
296 ± 2 K |
| Number of distinct elements |
6 |
| Space group number |
15 |
| Hermann-Mauguin space group symbol |
C 1 2/c 1 |
| Hall space group symbol |
-C 2yc |
| Residual factor for all reflections |
0.0637 |
| Residual factor for significantly intense reflections |
0.0401 |
| Weighted residual factors for significantly intense reflections |
0.0848 |
| Weighted residual factors for all reflections included in the refinement |
0.0949 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.027 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/2231090.html