Information card for entry 2231407
| Chemical name |
1,7,8,9,10,10-Hexachloro-4-(thiophen-2-ylmethyl)-4- azatricyclo[5.2.1.0^2,6^]dec-8-ene-3,5-dione |
| Formula |
C14 H7 Cl6 N O2 S |
| Calculated formula |
C14 H7 Cl6 N O2 S |
| SMILES |
[C@]12([C@H]3C(=O)N(C(=O)[C@H]3[C@@](C(=C1Cl)Cl)(C2(Cl)Cl)Cl)Cc1cccs1)Cl |
| Title of publication |
1,7,8,9,10,10-Hexachloro-4-(thiophen-2-ylmethyl)-4-azatricyclo[5.2.1.0^2,6^]dec-8-ene-3,5-dione |
| Authors of publication |
Manohar, R.; Harikrishna, M.; Ramanathan, C. R.; SureshKumar, M.; Gunasekaran, K. |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2011 |
| Journal volume |
67 |
| Journal issue |
9 |
| Pages of publication |
o2391 |
| a |
23.8136 ± 0.001 Å |
| b |
23.8136 ± 0.001 Å |
| c |
12.624 ± 0.0009 Å |
| α |
90° |
| β |
90° |
| γ |
90° |
| Cell volume |
7158.9 ± 0.7 Å3 |
| Cell temperature |
293 ± 2 K |
| Ambient diffraction temperature |
293 ± 2 K |
| Number of distinct elements |
6 |
| Space group number |
88 |
| Hermann-Mauguin space group symbol |
I 41/a :2 |
| Hall space group symbol |
-I 4ad |
| Residual factor for all reflections |
0.0815 |
| Residual factor for significantly intense reflections |
0.0371 |
| Weighted residual factors for significantly intense reflections |
0.068 |
| Weighted residual factors for all reflections included in the refinement |
0.0745 |
| Goodness-of-fit parameter for all reflections included in the refinement |
0.821 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/2231407.html