Information card for entry 2231435
| Chemical name |
<i>N</i>,<i>N</i>'-Bis[1-(thiophen-2-yl)ethylidene]ethane-1,2-diamine |
| Formula |
C14 H16 N2 S2 |
| Calculated formula |
C14 H16 N2 S2 |
| SMILES |
CC(=N\CC/N=C(/c1cccs1)C)/c1cccs1 |
| Title of publication |
<i>N</i>,<i>N</i>'-Bis[1-(thiophen-2-yl)ethylidene]ethane-1,2-diamine |
| Authors of publication |
Asiri, Abdullah M.; Al-Youbi, Abdulrahman O.; Faidallah, Hassan M.; Alamry, Khalid A.; Ng, Seik Weng |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2011 |
| Journal volume |
67 |
| Journal issue |
9 |
| Pages of publication |
o2465 |
| a |
5.5831 ± 0.0003 Å |
| b |
9.3939 ± 0.0004 Å |
| c |
12.9202 ± 0.0005 Å |
| α |
90° |
| β |
95.342 ± 0.004° |
| γ |
90° |
| Cell volume |
674.68 ± 0.05 Å3 |
| Cell temperature |
100 ± 2 K |
| Ambient diffraction temperature |
100 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/n 1 |
| Hall space group symbol |
-P 2yn |
| Residual factor for all reflections |
0.0503 |
| Residual factor for significantly intense reflections |
0.0346 |
| Weighted residual factors for significantly intense reflections |
0.0797 |
| Weighted residual factors for all reflections included in the refinement |
0.0901 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.035 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/2231435.html