Information card for entry 2231539
| Chemical name |
(1<i>E</i>,4<i>E</i>)-1,5-Bis(thiophen-3-yl)penta-1,4-dien-3-one |
| Formula |
C13 H10 O S2 |
| Calculated formula |
C13 H10 O S2 |
| SMILES |
s1cc(/C=C/C(=O)/C=C/c2cscc2)cc1 |
| Title of publication |
(1<i>E</i>,4<i>E</i>)-1,5-Bis(thiophen-3-yl)penta-1,4-dien-3-one |
| Authors of publication |
Shalini, S.; Girija, C. R.; Jotani, Mukesh M.; Rajashekhar, B.; Rao, Nageswar; Tiekink, Edward R. T. |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2011 |
| Journal volume |
67 |
| Journal issue |
9 |
| Pages of publication |
o2354 |
| a |
11.8908 ± 0.0003 Å |
| b |
7.1807 ± 0.0001 Å |
| c |
28.3004 ± 0.0006 Å |
| α |
90° |
| β |
90° |
| γ |
90° |
| Cell volume |
2416.41 ± 0.09 Å3 |
| Cell temperature |
293 ± 2 K |
| Ambient diffraction temperature |
293 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
61 |
| Hermann-Mauguin space group symbol |
P b c a |
| Hall space group symbol |
-P 2ac 2ab |
| Residual factor for all reflections |
0.0544 |
| Residual factor for significantly intense reflections |
0.0399 |
| Weighted residual factors for significantly intense reflections |
0.1044 |
| Weighted residual factors for all reflections included in the refinement |
0.1212 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.087 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/2231539.html