Information card for entry 2232075
| Chemical name |
2-(Biphenyl-4-yl)-5-[3-(4,5,6,7-tetrahydrothieno[3,2-<i>c</i>]pyridine- 5-ylsulfonyl)thiophen-2-yl]-1,3,4-oxadiazole |
| Formula |
C25 H19 N3 O3 S3 |
| Calculated formula |
C25 H19 N3 O3 S3 |
| SMILES |
S(=O)(=O)(N1Cc2ccsc2CC1)c1c(scc1)c1oc(nn1)c1ccc(c2ccccc2)cc1 |
| Title of publication |
2-(Biphenyl-4-yl)-5-[3-(4,5,6,7-tetrahydrothieno[3,2-<i>c</i>]pyridine-5-ylsulfonyl)thiophen-2-yl]-1,3,4-oxadiazole |
| Authors of publication |
Fun, Hoong-Kun; Hemamalini, Madhukar; Rai, Sankappa; Isloor, A. M.; Shetty, Prakash |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2011 |
| Journal volume |
67 |
| Journal issue |
10 |
| Pages of publication |
o2781 - o2782 |
| a |
7.9108 ± 0.0001 Å |
| b |
12.0943 ± 0.0001 Å |
| c |
12.9498 ± 0.0002 Å |
| α |
69.253 ± 0.001° |
| β |
76.794 ± 0.001° |
| γ |
77.46 ± 0.001° |
| Cell volume |
1115.3 ± 0.03 Å3 |
| Cell temperature |
100 ± 1 K |
| Ambient diffraction temperature |
100 ± 1 K |
| Number of distinct elements |
5 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for all reflections |
0.0928 |
| Residual factor for significantly intense reflections |
0.0529 |
| Weighted residual factors for significantly intense reflections |
0.106 |
| Weighted residual factors for all reflections included in the refinement |
0.1216 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.025 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/2232075.html