Information card for entry 2232391
| Chemical name |
Bis[2,4-dichloro-6-(ethyliminomethyl)phenolato-κ^2^<i>N</i>,<i>O</i>]nickel(II) |
| Formula |
C18 H16 Cl4 N2 Ni O2 |
| Calculated formula |
C18 H16 Cl4 N2 Ni O2 |
| SMILES |
c12c(cc(Cl)cc2C=[N](CC)[Ni]2(O1)[N](=Cc1c(c(cc(c1)Cl)Cl)O2)CC)Cl |
| Title of publication |
Bis[2,4-dichloro-6-(ethyliminomethyl)phenolato-κ^2^<i>N</i>,<i>O</i>]nickel(II) |
| Authors of publication |
Huang, Qiu Ping; Zhang, Shu Hua; Guo, Jing Jing; Feng, Chao; Tang, Fu Shun |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2011 |
| Journal volume |
67 |
| Journal issue |
11 |
| Pages of publication |
m1611 |
| a |
7.5004 ± 0.0006 Å |
| b |
9.3155 ± 0.0007 Å |
| c |
14.1498 ± 0.0012 Å |
| α |
90° |
| β |
103.841 ± 0.001° |
| γ |
90° |
| Cell volume |
959.94 ± 0.13 Å3 |
| Cell temperature |
293 ± 2 K |
| Ambient diffraction temperature |
293 ± 2 K |
| Number of distinct elements |
6 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.0457 |
| Residual factor for significantly intense reflections |
0.0312 |
| Weighted residual factors for significantly intense reflections |
0.0516 |
| Weighted residual factors for all reflections included in the refinement |
0.0547 |
| Goodness-of-fit parameter for all reflections included in the refinement |
0.971 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/2232391.html