Information card for entry 2233159
| Chemical name |
(<i>S</i>)-4-Phenyl-2-(1,2,3,4-tetrahydroisoquinolin-3-yl)-1,3-thiazole |
| Formula |
C18 H16 N2 S |
| Calculated formula |
C18 H16 N2 S |
| SMILES |
s1c(nc(c1)c1ccccc1)[C@H]1NCc2ccccc2C1 |
| Title of publication |
(<i>S</i>)-4-Phenyl-2-(1,2,3,4-tetrahydroisoquinolin-3-yl)-1,3-thiazole |
| Authors of publication |
Pawar, Sunayna; Bhatt, Pralav; Govender, Thavendran; Kruger, Hendrik G.; Maguire, Glenn E. M. |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2012 |
| Journal volume |
68 |
| Journal issue |
1 |
| Pages of publication |
o176 |
| a |
16.223 ± 0.001 Å |
| b |
16.223 ± 0.001 Å |
| c |
4.813 ± 0.0003 Å |
| α |
90° |
| β |
90° |
| γ |
120° |
| Cell volume |
1097.01 ± 0.12 Å3 |
| Cell temperature |
173 ± 2 K |
| Ambient diffraction temperature |
173 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
145 |
| Hermann-Mauguin space group symbol |
P 32 |
| Hall space group symbol |
P 32 |
| Residual factor for all reflections |
0.0436 |
| Residual factor for significantly intense reflections |
0.0352 |
| Weighted residual factors for significantly intense reflections |
0.0811 |
| Weighted residual factors for all reflections included in the refinement |
0.0843 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.034 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/2233159.html