Information card for entry 2233528
| Chemical name |
<i>N</i>,<i>N</i>'-[1,4-Phenylenebis(methylene)]bis(<i>N</i>,<i>N</i>- diethylethanaminium) dibromide |
| Formula |
C20 H38 Br2 N2 |
| Calculated formula |
C20 H38 Br2 N2 |
| SMILES |
CC[N+](CC)(CC)Cc1ccc(C[N+](CC)(CC)CC)cc1.[Br-].[Br-] |
| Title of publication |
<i>N</i>,<i>N</i>'-[1,4-Phenylenebis(methylene)]bis(<i>N</i>,<i>N</i>-diethylethanaminium) dibromide |
| Authors of publication |
Abdul Rahim, Munirah Sufiyah; Khaledi, Hamid; Alias, Yatimah; Welz-Biermann, Urs |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2012 |
| Journal volume |
68 |
| Journal issue |
2 |
| Pages of publication |
o369 |
| a |
8.2713 ± 0.0005 Å |
| b |
14.144 ± 0.0009 Å |
| c |
9.0762 ± 0.0006 Å |
| α |
90° |
| β |
97.634 ± 0.001° |
| γ |
90° |
| Cell volume |
1052.41 ± 0.12 Å3 |
| Cell temperature |
100 ± 2 K |
| Ambient diffraction temperature |
100 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/n 1 |
| Hall space group symbol |
-P 2yn |
| Residual factor for all reflections |
0.0204 |
| Residual factor for significantly intense reflections |
0.0174 |
| Weighted residual factors for significantly intense reflections |
0.0423 |
| Weighted residual factors for all reflections included in the refinement |
0.0433 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.063 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/2233528.html