Information card for entry 2233587
| Chemical name |
(<i>E</i>)-5-(2-Chlorophenyl)-7-ethyl-2-oxo-2,3-dihydro-1<i>H</i>-thieno[2,3-<i>e</i>][1,4]diazepin-4-ium 2,4,6-trinitrophenolate |
| Formula |
C21 H16 Cl N5 O8 S |
| Calculated formula |
C21 H16 Cl N5 O8 S |
| Title of publication |
(<i>E</i>)-5-(2-Chlorophenyl)-7-ethyl-2-oxo-2,3-dihydro-1<i>H</i>-thieno[2,3-<i>e</i>][1,4]diazepin-4-ium 2,4,6-trinitrophenolate |
| Authors of publication |
Betz, Richard; Gerber, Thomas; Hosten, Eric; Dayananda, Alaloor S.; Yathirajan, Hemmige S.; Ramesha, A. R. |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2012 |
| Journal volume |
68 |
| Journal issue |
2 |
| Pages of publication |
o516 - o517 |
| a |
10.5704 ± 0.0002 Å |
| b |
20.0667 ± 0.0005 Å |
| c |
11.3741 ± 0.0002 Å |
| α |
90° |
| β |
110.666 ± 0.001° |
| γ |
90° |
| Cell volume |
2257.35 ± 0.08 Å3 |
| Cell temperature |
200 ± 2 K |
| Ambient diffraction temperature |
200 ± 2 K |
| Number of distinct elements |
6 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.0352 |
| Residual factor for significantly intense reflections |
0.0309 |
| Weighted residual factors for significantly intense reflections |
0.0771 |
| Weighted residual factors for all reflections included in the refinement |
0.0813 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.051 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
Yes |
| Has Fobs |
Yes |
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https://www.crystallography.net/2233587.html