Information card for entry 2233666
| Chemical name |
[<i>N</i>,<i>N</i>-Bis(2-aminoethyl)ethane-1,2-diamine](ethane-1,2- diamine)nickel(II) thiosulfate trihydrate |
| Formula |
C8 H32 N6 Ni O6 S2 |
| Calculated formula |
C8 H32 N6 Ni O6 S2 |
| Title of publication |
[<i>N</i>,<i>N</i>-Bis(2-aminoethyl)ethane-1,2-diamine](ethane-1,2-diamine)nickel(II) thiosulfate trihydrate |
| Authors of publication |
Seidlhofer, Beatrix; Näther, Christian; Bensch, Wolfgang |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2012 |
| Journal volume |
68 |
| Journal issue |
2 |
| Pages of publication |
m167 - m168 |
| a |
10.89 ± 0.002 Å |
| b |
10.0494 ± 0.0017 Å |
| c |
16.689 ± 0.003 Å |
| α |
90° |
| β |
96.68 ± 0.02° |
| γ |
90° |
| Cell volume |
1814 ± 0.6 Å3 |
| Cell temperature |
170 ± 2 K |
| Ambient diffraction temperature |
170 ± 2 K |
| Number of distinct elements |
6 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/n 1 |
| Hall space group symbol |
-P 2yn |
| Residual factor for all reflections |
0.0401 |
| Residual factor for significantly intense reflections |
0.0366 |
| Weighted residual factors for significantly intense reflections |
0.0967 |
| Weighted residual factors for all reflections included in the refinement |
0.0991 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.053 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
Yes |
| Has Fobs |
Yes |
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https://www.crystallography.net/2233666.html