Information card for entry 2233890
| Chemical name |
5-Sulfanylidene-2<i>H</i>,5<i>H</i>-1,3-dithiolo[4,5-<i>d</i>][1,3]dithiol-2-one |
| Formula |
C4 O S5 |
| Calculated formula |
C4 O S5 |
| SMILES |
S=C1SC2SC(=O)SC=2S1 |
| Title of publication |
5-Sulfanylidene-2<i>H</i>,5<i>H</i>-1,3-dithiolo[4,5-<i>d</i>][1,3]dithiol-2-one |
| Authors of publication |
Wen, Hua-Wen; Fan, Li-Xia; Liu, Li; Li, Ao; Fang, Qi |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2012 |
| Journal volume |
68 |
| Journal issue |
3 |
| Pages of publication |
o721 |
| a |
3.9638 ± 0.0002 Å |
| b |
11.0211 ± 0.0008 Å |
| c |
8.711 ± 0.0007 Å |
| α |
90° |
| β |
101.344 ± 0.005° |
| γ |
90° |
| Cell volume |
373.11 ± 0.05 Å3 |
| Cell temperature |
294 ± 2 K |
| Ambient diffraction temperature |
294 ± 2 K |
| Number of distinct elements |
3 |
| Space group number |
7 |
| Hermann-Mauguin space group symbol |
P 1 n 1 |
| Hall space group symbol |
P -2yac |
| Residual factor for all reflections |
0.0521 |
| Residual factor for significantly intense reflections |
0.044 |
| Weighted residual factors for significantly intense reflections |
0.1244 |
| Weighted residual factors for all reflections included in the refinement |
0.1296 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.116 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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