Information card for entry 2234113
| Chemical name |
(2<i>E</i>,4<i>E</i>)-Ethyl 5-(phenylsulfonyl)penta-2,4-dienoate |
| Formula |
C13 H14 O4 S |
| Calculated formula |
C13 H14 O4 S |
| SMILES |
c1ccccc1S(=O)(=O)/C=C/C=C/C(=O)OCC |
| Title of publication |
(2<i>E</i>,4<i>E</i>)-Ethyl 5-(phenylsulfonyl)penta-2,4-dienoate |
| Authors of publication |
Sankar, Ulaganathan; Sabari, V.; Suresh, G.; Uma, Ramakrishnan; Aravindhan, S. |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2012 |
| Journal volume |
68 |
| Journal issue |
4 |
| Pages of publication |
o1093 |
| a |
6.2525 ± 0.0003 Å |
| b |
7.8889 ± 0.0004 Å |
| c |
14.5049 ± 0.0007 Å |
| α |
82.828 ± 0.003° |
| β |
87.261 ± 0.002° |
| γ |
72.426 ± 0.002° |
| Cell volume |
676.69 ± 0.06 Å3 |
| Cell temperature |
298 ± 2 K |
| Ambient diffraction temperature |
298 ± 2 K |
| Number of distinct elements |
4 |
| Space group number |
2 |
| Hermann-Mauguin space group symbol |
P -1 |
| Hall space group symbol |
-P 1 |
| Residual factor for all reflections |
0.0508 |
| Residual factor for significantly intense reflections |
0.0427 |
| Weighted residual factors for significantly intense reflections |
0.1412 |
| Weighted residual factors for all reflections included in the refinement |
0.1467 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.874 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/2234113.html