Information card for entry 2234279
| Common name |
Rubrene endoperoxide acetone monosolvate |
| Chemical name |
1,3,10,12-tetraphenyl-19,20- dioxapentacyclo[10.6.2.0^2,11^.0^4,9^.0^13,18^]icosa- 2(11),3,5,7,9,13,15,17-octaene acetone monosolvate |
| Formula |
C45 H34 O3 |
| Calculated formula |
C45 H34 O3 |
| SMILES |
O1O[C@@]2(c3ccccc3[C@]1(c1c(c3ccccc3c(c21)c1ccccc1)c1ccccc1)c1ccccc1)c1ccccc1.O=C(C)C |
| Title of publication |
Rubrene endoperoxide acetone monosolvate |
| Authors of publication |
Shinashi, Kiyoaki; Uchida, Akira |
| Journal of publication |
Acta Crystallographica Section E |
| Year of publication |
2012 |
| Journal volume |
68 |
| Journal issue |
4 |
| Pages of publication |
o995 - o996 |
| a |
11.1592 ± 0.0006 Å |
| b |
21.2248 ± 0.0011 Å |
| c |
13.6121 ± 0.0007 Å |
| α |
90° |
| β |
103.113 ± 0.001° |
| γ |
90° |
| Cell volume |
3140 ± 0.3 Å3 |
| Cell temperature |
90 ± 1 K |
| Ambient diffraction temperature |
90 ± 1 K |
| Number of distinct elements |
3 |
| Space group number |
14 |
| Hermann-Mauguin space group symbol |
P 1 21/c 1 |
| Hall space group symbol |
-P 2ybc |
| Residual factor for all reflections |
0.0798 |
| Residual factor for significantly intense reflections |
0.0491 |
| Weighted residual factors for significantly intense reflections |
0.1048 |
| Weighted residual factors for all reflections included in the refinement |
0.1192 |
| Goodness-of-fit parameter for all reflections included in the refinement |
1.033 |
| Diffraction radiation wavelength |
0.71073 Å |
| Diffraction radiation type |
MoKα |
| Has coordinates |
Yes |
| Has disorder |
No |
| Has Fobs |
Yes |
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https://www.crystallography.net/2234279.html